JEOL NeoScope™ Benchtop SEM
Technical specifications of the microscope itself:
Resolution: 6nm (@15kV)
Magnification: x24 - 200,000
Accelerating Voltage: 5 kV, 10 kV, 15 kV (3 stages)
Vacuum modes: High Vacuum, Low Vacuum and Charge compensation pressure
This SEM is equipped with:
JEOL 30mm2 x-ray EDS detector

This microscope boasts the capability of being portable, so it can travel and be set up anywhere, as long as there is a power supply and stable ground. For companies or education providers where access to the lab may not be possible, this microscope and its ability to travel could present a preferable opportunity. If you would like to enquire about use of the NeoScope outside of the PEMC setting, please contact us.