C
Menu
O
M
B
A
Login
O
M
Student
Staff
Study
Courses
Undergraduate
Postgraduate
Postgraduate research
Professional development
Student life
Accommodation
Open days
Library services
New and returning students
Semester dates
Research
Institutes
Impact
Postgraduate research
Library services
Research Excellence Framework 2021
International
Application advice
Exchange opportunities
Country guides
Advice for international students
Accommodation
Business
Professional development
Degree apprenticeships
Knowledge Transfer Partnerships
Partnerships
Collaborate
About
Strategy, mission and vision
Governance
Alumni
News
Visit
Working here
Public arts programme
Contact
Coronavirus (COVID-19)
/
Home
/
About the University
/
University structure
/
Faculties
/
Faculty of Science and Engineering
/
Electron Microscopy Centre
/
PEMC equipment
Share
Twitter
Facebook
LinkedIn
Email
PEMC equipment
The available equipment offered by the PEMC
Available equipment
JEOL 1400 TEM
JEOL 6610 LV SEM
JEOL 7001 FE SEM
Zeiss Crossbeam 550 FIB-SEM
JEOL NeoScope⢠Benchtop SEM
JEOL IB-19520CCP Cooling Cross Section Polisher
Sample preparation
(
PEMC page
2
Available techniques
Also in
Electron Microscopy Centre
3D Printing a Coccolithophore from FIB-SEM Data
3D reconstruction of porous materials through FIB-SEM
ARC Marine Case Study
Automated Mineralogy
Case Studies
Cathodoluminescence
Classifying meteorites using scanning electron microscopy application of SEM-EDS on extraterrestrial samples
Composite Innovations Ltd case study
Cryo-Scanning Electron Microscopy
DavyJ Ltd Case Study
Dynamics of formation and secretion of heterococcoliths by Coccolithus pelagicus
Electron Backscatter Diffraction (EBSD)
Electron Beam Lithography (EBL)
Energy Dispersive Spectroscopy (EDS)
Enigma Audio Case Study
Esterlam International Ltd case study
Facilities at Plymouth Electron Microscopy Centre
FIB-SEM: Under the hood
Focused Ion Beam
Gas Injection System (GIS)
Hunting for meteorites in the Nullarbor Plain
Imaging Matters
Industrial Case Studies
Internal teaching and training
JEOL 1400 TEM
JEOL 6610 LV SEM
JEOL 7001 FE SEM
JEOL IB-19520CCP Cooling Cross Section Polisher
JEOL NeoScope⢠Benchtop SEM
Large Area Mapping
Low Vacuum Mode (variable pressure)
Low Voltage - Scanning Transmission Electron Microscopy (LV-STEM)
Microscopic study of (assemblies of) nano-objects
Microscopy Live!
Owens Case Study
PEMC sample preparation
PEMC techniques
Plessey Semiconductors Ltd case one
Plessey Semiconductors Ltd case study
Plessey Semiconductors Ltd case three
Plessey Semiconductors Ltd case two
Plymouth Electron Microscopy Centre (PEMC)
Plymouth Electron Microscopy Centre events
Plymouth Materials Characterisation Network
Plymouth Materials Characterisation Project (PMCP)
PML Applications Ltd Case Study
Pollenize case study
Radley Scientific case study
Ramer Sponges Ltd Case Study
Research and publications