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Electron Microscopy Centre
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PEMC equipment
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PEMC equipment
The available equipment offered by the PEMC
Available equipment
JEOL 1400 TEM
JEOL 6610 LV SEM
JEOL 7001 FE SEM
Zeiss Crossbeam 550 FIB-SEM
Sample Preparation
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PEMC page
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Available techniques
Also in
Electron Microscopy Centre
3D reconstruction of porous materials through FIB-SEM
ARC Marine Case Study
Case Studies
Cathodoluminescence
Composite Innovations Ltd case study
Cryo-Scanning Electron Microscopy
DavyJ Ltd Case Study
Dynamics of formation and secretion of heterococcoliths by Coccolithus pelagicus
Electron Backscatter Diffraction (EBSD)
Electron Beam Lithography (EBL)
Energy Dispersive Spectroscopy (EDS)
Enigma Audio Case Study
Esterlam International Ltd case study
Facilities at Plymouth Electron Microscopy Centre
FIB-SEM: Under the hood
Focused Ion Beam
Gas Injection System (GIS)
Hunting for meteorites in the Nullarbor Plain
Industrial Case Studies
Internal training
JEOL 1400 TEM
JEOL 6610 LV SEM
JEOL 7001 FE SEM
Large Area Mapping
Low Vacuum Mode (variable pressure)
Low Voltage - Scanning Transmission Electron Microscopy (LV-STEM)
Low Voltage-STEM vs TEM
Microscopic study of (assemblies of) nano-objects
Owens Case Study
PEMC sample preparation
PEMC techniques
Plessey Semiconductors Ltd case one
Plessey Semiconductors Ltd case study
Plessey Semiconductors Ltd case three
Plessey Semiconductors Ltd case two
Plymouth Electron Microscopy Centre (PEMC)
Plymouth Electron Microscopy Centre news and events
Plymouth Materials Characterisation Project (PMCP)
PML Applications Ltd Case Study
Radley Scientific case study
Ramer Sponges Ltd Case Study
Research and publications
Research Case Studies
Scanning Electron Microscopy (SEM)
Scarlet PL case study
Schools liaison and outreach
Serial Sectioning Tomography
South West Metal Finishing Case Study
Teaching and learning
TEM Tomography
Testing the Capabilities of Automated Mineralogy in Mining
The Effect of Different Post-Electroplating Surface Modification Treatments on Tin Whisker Growth
Thin section lift-out
Training and development
Transmission Electron Microscopy (TEM)
Working with industry
ZEISS Crossbeam 550 FIB-SEM
