Transmission Electron Microscopy (TEM)


Transmission Electron Microscopy (TEM) utilises a high energised electron beam to penetrate through an ultrathin specimen which is mostly less than 100 nm. Electron signals are collected from the interaction between the incident beam and the sample. However, compared to SEM, it collects the transmitted electrons to form an image. Due to this nature, the image resolution is generally higher than SEM imaging.

<p>TEM instruction</p>