JEOL 1400 TEM

This Transmission Electron Microscope operates at until 120 kV
JEOL 1400 TEM

Technical specification of the microscope is below:

Resolution: 0.38 nm
Magnification: 10 – 1,200,000x
Accelerating Voltage: 40 – 120 kV

This TEM is equipped with:

  • Gatan Orius camera

Sample preparation

Due to the fact that incident electrons need to penetrate through the sample, so that transmitted electron signal would be collected for imaging, the sample thickness needs to be limited (e.g. 50 to 250 nm for biological samples). Therefore specified sample preparation is necessary, see support equipment for more information. 

Available techniques