Zeiss Sigma 300 LV FE SEM A variable pressure Field Emission SEM, equipped with analytical capabilities including Zeiss Mineralogic.
Technical specification Resolution: 1 nm (@ 15 kV) Magnification: 10 - 1,000,000x Acceleration Voltage: 0.02 - 30 kV Vacuum Mode: High vacuum, low vacuum/variable pressure
Equipment specificationBuilt-in Detectors SE2 - Secondary Electron Detector InLens - Secondary Electron Detector within column BSD - Backscatter Electron Detector (retractable) Panchromatic Cathodoluminescence LVSED - Low Vacuum Secondary Electron Detector Analytical Detectors2 x OI Ultimax 65 mm2 EDX