Technical specification of the microscope itself is below:
Resolution: 1.2 nm (@ 30 kV)
Magnification: 10 – 500,000x
Accelerating Voltage: 0.5 – 30 kV
This SEM is equipped with:
- OI Nordlys EBSD (materials)
- OI WAVE WDS
- OI X-Max 50mm2 EDS
- Deben STEM Detector, generation 5
- Tensile test stage: Gatan Micro-test 2000