JEOL IT510 LV SEM
A variable pressure SEM fitted with a tungsten filament and analytical capabilities.
Technical specification of this microscope is below:
Resolution: 3.0 nm (@ 30 kV)
Magnification: 5 - 300,000x
Acceleration Voltage: 0.3 - 30 kV
Vacuum Mode: High vacuum, low vacuum/variable pressure
Magnification: 5 - 300,000x
Acceleration Voltage: 0.3 - 30 kV
Vacuum Mode: High vacuum, low vacuum/variable pressure
This SEM is equipped with:
- OI Xplore 30 mm2 EDX
- JEOL Low Vacuum Secondary Electron Detector
