Plessey Semiconductors Ltd case study
Case study highlighting how Plessey SemiConductors Ltd benefitted from the Plymouth Materials Characterisation Project (PMCP)
3D reconstruction of porous materials through FIB-SEM
University of Plymouth Electron Microscopy Centre (PEMC) 3D reconstruction of porous materials through FIB-SEM.
Thin section lift-out
A technique used for preparing thin lamella in FIB-SEM with nano-manipulator.
Composite Innovations Ltd case study
Case study highlighting how Composite Innovations Ltd benefited from the Plymouth Materials Characterisation Project (PMCP), enabling the company to continually improve their processes
Focused Ion Beam
Focused Ion Beam is a column powered by liquid metal ion sources (LMIS) to provide a gallium ion beam.
Serial Sectioning Tomography
Serial Sectioning Tomography relates to the 3D acquisition technique realised in a FIB-SEM dual beam system.
Plessey Semiconductors Ltd case three
Plessey Semiconductors Ltd case three: faults investigation in LED chips
Plessey Semiconductors Ltd case two
Plessey Semiconductors Ltd case two: dead pixel study