
Profiles
Dr Tom O'Hanlon
Technical Specialist (Electron Microscopy - Engineering & Materials Sciences)
Faculty of Science and Engineering
Biography
Biography
Tom O’Hanlon is a Technical Specialist in electron microscopy, specialising in focused ion beam scanning electron microscopy (FIB-SEM). With a background in materials science, Tom’s previous research focused on correlative investigations of gallium nitride-based semiconductor materials.
Tom’s role with the EU-funded Plymouth Materials Characterisation Network (and previous work with the Plymouth Materials Characterisation Project) supports the microscopy and analysis needs of businesses across a range of industries in the south-west of England.
Qualifications
PhD in Materials Science, University of Cambridge. "Development of Multi-Microscopy Techniques for the Characterisation of Nitride Semiconductors." (2018)
MSci in Natural Sciences (Materials Science), University of Cambridge (2012)
Professional membership
Member of the Royal Microscopy Society
Key publications
Publications
Publications
Key publications
Key publications are highlighted
Journals