Dr Tom O'Hanlon

Technical Specialist for the focused ion beam scanning electron microscope (FIB-SEM) working on the Plymouth Materials Characterisation Project (PMCP).

Qualifications

PhD in Materials Science, University of Cambridge. "Development of Multi-Microscopy Techniques for the Characterisation of Nitride Semiconductors." (2018)

MSci in Natural Sciences (Materials Science), University of Cambridge (2012)