Dr Tom O'Hanlon
Technical Specialist (Electron Microscopy)
Faculty of Science and Engineering
Technical Specialist for the focused ion beam scanning electron microscope (FIB-SEM) working on the Plymouth Materials Characterisation Network (PMCN).
PhD in Materials Science, University of Cambridge. "Development of Multi-Microscopy Techniques for the Characterisation of Nitride Semiconductors." (2018)
MSci in Natural Sciences (Materials Science), University of Cambridge (2012)
Member of the Royal Microscopy Society
Key publications are highlightedJournals