Dr Tom O'Hanlon
Technical Specialist (Electron Microscopy - Engineering & Materials Sceinces)
Faculty of Science and Engineering
Tom O’Hanlon is a Technical Specialist in electron microscopy, specialising in focused ion beam scanning electron microscopy (FIB-SEM). With a background in materials science, Tom’s previous research focused on correlative investigations of gallium nitride-based semiconductor materials.
Tom’s role with the EU-funded Plymouth Materials Characterisation Network (and previous work with the Plymouth Materials Characterisation Project) supports the microscopy and analysis needs of businesses across a range of industries in the south-west of England.
PhD in Materials Science, University of Cambridge. "Development of Multi-Microscopy Techniques for the Characterisation of Nitride Semiconductors." (2018)
MSci in Natural Sciences (Materials Science), University of Cambridge (2012)
Member of the Royal Microscopy Society
Key publications are highlightedJournals